Edge detection in micrometrology with nearly confocal microscopy
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Standard
Edge detection in micrometrology with nearly confocal microscopy. / Sheppard, CJR; Cox, Ingemar J; Hamilton, DK.
I: Applied Optics, Bind 23, Nr. 5, 1984, s. 657-658.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt
Harvard
Sheppard, CJR, Cox, IJ & Hamilton, DK 1984, 'Edge detection in micrometrology with nearly confocal microscopy', Applied Optics, bind 23, nr. 5, s. 657-658.
APA
Sheppard, CJR., Cox, I. J., & Hamilton, DK. (1984). Edge detection in micrometrology with nearly confocal microscopy. Applied Optics, 23(5), 657-658.
Vancouver
Sheppard CJR, Cox IJ, Hamilton DK. Edge detection in micrometrology with nearly confocal microscopy. Applied Optics. 1984;23(5):657-658.
Author
Bibtex
@article{c7a97d921dc74f1f91a8a4b1d8791e5b,
title = "Edge detection in micrometrology with nearly confocal microscopy",
author = "CJR Sheppard and Cox, {Ingemar J} and DK Hamilton",
year = "1984",
language = "English",
volume = "23",
pages = "657--658",
journal = "Applied Optics",
issn = "1559-128X",
publisher = "Optical Society of America",
number = "5",
}
RIS
TY - JOUR
T1 - Edge detection in micrometrology with nearly confocal microscopy
AU - Sheppard, CJR
AU - Cox, Ingemar J
AU - Hamilton, DK
PY - 1984
Y1 - 1984
M3 - Journal article
VL - 23
SP - 657
EP - 658
JO - Applied Optics
JF - Applied Optics
SN - 1559-128X
IS - 5
ER -
ID: 98300265