## Estimating the thickness of ultra thin sections for electron microscopy by image statistics

Publikation: Bidrag til bog/antologi/rapportKonferencebidrag i proceedingsForskningfagfællebedømt

We propose a method for estimating the thickness of ultra thin histological sections by image statistics alone. Our method works for images, that are the realisations of a stationary and isotropic stochastic process, and it relies on the existence of statistical image-measures that are strictly monotonic with distance. We propose to use the standard deviation of the difference between pixel values as a function of distance, and we give an extremely simple, linear algorithm. Our algorithm is applied to the challenging domain of electron microscopic sections supposedly $45\text{ nm}$ apart, and we show that these images with high certainty belong to the required statistical class, and that the reconstructions are valid.
Originalsprog Engelsk 2014 IEEE International Symposium on Biomedical Imaging 4 IEEE 2014 157-160 978-1-4673-1959-1 https://doi.org/10.1109/ISBI.2014.6867833 Udgivet - 2014 International Symposium on Biomedical Imaging - Beijing, KinaVarighed: 28 apr. 2014 → 2 maj 2014

### Konference

Konference International Symposium on Biomedical Imaging Kina Beijing 28/04/2014 → 02/05/2014

ID: 161621598