Standard
BASELINE RELIABILITY OF EEG AND ERP IN A FOUR-WAY CROSSOVER STUDY IN HEALTHY SUBJECTS. / Ip, Chengteng; Ganz, Melanie; Ozenne, Brice; Sluth, Lasse; Gram, Mikkel; Viardot, Geoffrey; l'Hostis, Philippe; Danjou, Philippe; Kundsen, Gitte; Christensen, Søren.
2017. S59.
Publikation: Konferencebidrag › Konferenceabstrakt til konference › Forskning › fagfællebedømt
Harvard
Ip, C, Ganz, M, Ozenne, B, Sluth, L, Gram, M, Viardot, G, l'Hostis, P, Danjou, P, Kundsen, G & Christensen, S 2017, 'BASELINE RELIABILITY OF EEG AND ERP IN A FOUR-WAY CROSSOVER STUDY IN HEALTHY SUBJECTS', s. S59.
APA
Ip, C., Ganz, M., Ozenne, B., Sluth, L., Gram, M., Viardot, G., l'Hostis, P., Danjou, P., Kundsen, G., & Christensen, S. (2017). BASELINE RELIABILITY OF EEG AND ERP IN A FOUR-WAY CROSSOVER STUDY IN HEALTHY SUBJECTS. S59.
Vancouver
Ip C, Ganz M, Ozenne B, Sluth L, Gram M, Viardot G o.a.. BASELINE RELIABILITY OF EEG AND ERP IN A FOUR-WAY CROSSOVER STUDY IN HEALTHY SUBJECTS. 2017.
Author
Ip, Chengteng ; Ganz, Melanie ; Ozenne, Brice ; Sluth, Lasse ; Gram, Mikkel ; Viardot, Geoffrey ; l'Hostis, Philippe ; Danjou, Philippe ; Kundsen, Gitte ; Christensen, Søren. / BASELINE RELIABILITY OF EEG AND ERP IN A FOUR-WAY CROSSOVER STUDY IN HEALTHY SUBJECTS. 1 s.
Bibtex
@conference{69d0eae746314352acf1bd6cb77330a6,
title = "BASELINE RELIABILITY OF EEG AND ERP IN A FOUR-WAY CROSSOVER STUDY IN HEALTHY SUBJECTS",
keywords = "test-retest reliability, EEG, ERP",
author = "Chengteng Ip and Melanie Ganz and Brice Ozenne and Lasse Sluth and Mikkel Gram and Geoffrey Viardot and Philippe l'Hostis and Philippe Danjou and Gitte Kundsen and S{\o}ren Christensen",
year = "2017",
language = "English",
pages = "S59",
}
RIS
TY - ABST
T1 - BASELINE RELIABILITY OF EEG AND ERP IN A FOUR-WAY CROSSOVER STUDY IN HEALTHY SUBJECTS
AU - Ip, Chengteng
AU - Ganz, Melanie
AU - Ozenne, Brice
AU - Sluth, Lasse
AU - Gram, Mikkel
AU - Viardot, Geoffrey
AU - l'Hostis, Philippe
AU - Danjou, Philippe
AU - Kundsen, Gitte
AU - Christensen, Søren
PY - 2017
Y1 - 2017
KW - test-retest reliability
KW - EEG
KW - ERP
M3 - Conference abstract for conference
SP - S59
ER -
