Standard
ROTATION INVARIANT TEXTURE RECOGNITION USING A STEERABLE PYRAMID. / GREENSPAN, H; BELONGIE, S; GOODMAN, R; PERONA, P.
In:
International Conference on Pattern Recognition, 1994, p. 162-167.
Research output: Contribution to journal › Conference article › Research › peer-review
Harvard
GREENSPAN, H, BELONGIE, S, GOODMAN, R & PERONA, P 1994, 'ROTATION INVARIANT TEXTURE RECOGNITION USING A STEERABLE PYRAMID', International Conference on Pattern Recognition, pp. 162-167.
APA
GREENSPAN, H., BELONGIE, S., GOODMAN, R., & PERONA, P. (1994). ROTATION INVARIANT TEXTURE RECOGNITION USING A STEERABLE PYRAMID. International Conference on Pattern Recognition, 162-167.
Vancouver
GREENSPAN H, BELONGIE S, GOODMAN R, PERONA P. ROTATION INVARIANT TEXTURE RECOGNITION USING A STEERABLE PYRAMID. International Conference on Pattern Recognition. 1994;162-167.
Author
GREENSPAN, H ; BELONGIE, S ; GOODMAN, R ; PERONA, P. / ROTATION INVARIANT TEXTURE RECOGNITION USING A STEERABLE PYRAMID. In: International Conference on Pattern Recognition. 1994 ; pp. 162-167.
Bibtex
@inproceedings{b984260f546f442bb12ae13baa61b00d,
title = "ROTATION INVARIANT TEXTURE RECOGNITION USING A STEERABLE PYRAMID",
author = "H GREENSPAN and S BELONGIE and R GOODMAN and P PERONA",
year = "1994",
language = "English",
pages = "162--167",
journal = "Proceedings - International Conference on Pattern Recognition",
issn = "1051-4651",
publisher = "I E E E Computer Society",
note = "Conference B on Pattern Recognition and Neural Networks, at the 12th IAPR International Conference on Pattern Recognition ; Conference date: 09-10-1994 Through 13-10-1994",
}
RIS
TY - GEN
T1 - ROTATION INVARIANT TEXTURE RECOGNITION USING A STEERABLE PYRAMID
AU - GREENSPAN, H
AU - BELONGIE, S
AU - GOODMAN, R
AU - PERONA, P
PY - 1994
Y1 - 1994
M3 - Conference article
SP - 162
EP - 167
JO - Proceedings - International Conference on Pattern Recognition
JF - Proceedings - International Conference on Pattern Recognition
SN - 1051-4651
T2 - Conference B on Pattern Recognition and Neural Networks, at the 12th IAPR International Conference on Pattern Recognition
Y2 - 9 October 1994 through 13 October 1994
ER -
