Learning to detect and match keypoints with deep architectures

Research output: Contribution to conferencePaperResearchpeer-review

Feature detection and description is a pivotal step in many computer vision pipelines. Traditionally, human engineered features have been the main workhorse in this domain. In this paper, we present a novel approach for learning to detect and describe keypoints from images leveraging deep architectures. To allow for a learning based approach, we collect a large-scale dataset of patches with matching multiscale keypoints. The proposed model learns from this vast dataset to identify and describe meaningful keypoints. We evaluate our model for the effectiveness of its learned representations for detecting multiscale keypoints and describing their respective support regions.

Original languageEnglish
Publication date2016
DOIs
Publication statusPublished - 2016
Externally publishedYes
Event27th British Machine Vision Conference, BMVC 2016 - York, United Kingdom
Duration: 19 Sep 201622 Sep 2016

Conference

Conference27th British Machine Vision Conference, BMVC 2016
CountryUnited Kingdom
CityYork
Period19/09/201622/09/2016
SponsorARM, Disney Research, et al., HP, Ocado Technology, OSRAM

Bibliographical note

Funding Information:
We would like to thank Michael Wilber and Tsung-Yi Lin for their valuable input. This work was supported by the KACST Graduate Studies Scholarship.

Publisher Copyright:
© 2016. The copyright of this document resides with its authors.

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