Jet based feature classification
Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review
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Jet based feature classification. / Lillholm, Martin; Pedersen, Kim Steenstrup.
Proceedings of the 17th International Conference on Pattern Recognition, 2004: ICPR 2004. IEEE, 2004. p. 787-790.Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review
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TY - GEN
T1 - Jet based feature classification
AU - Lillholm, Martin
AU - Pedersen, Kim Steenstrup
N1 - Conference code: 17
PY - 2004
Y1 - 2004
N2 - We investigate to which extent the "raw" mapping of Taylor series coefficients into jet-space can be used as a "language" for describing local image structure in terms of geometrical image features. Based on empirical data from the van Hateren database, we discuss modelling of probability densities for different feature types, calculate feature posterior maps, and finally perform classification or simultaneous feature detection in a Bayesian framework. We introduce the Brownian image model as a generic background class and extend with empirically estimated densities for edges and blobs. We give examples of simultaneous feature detection across scale.
AB - We investigate to which extent the "raw" mapping of Taylor series coefficients into jet-space can be used as a "language" for describing local image structure in terms of geometrical image features. Based on empirical data from the van Hateren database, we discuss modelling of probability densities for different feature types, calculate feature posterior maps, and finally perform classification or simultaneous feature detection in a Bayesian framework. We introduce the Brownian image model as a generic background class and extend with empirically estimated densities for edges and blobs. We give examples of simultaneous feature detection across scale.
U2 - 10.1109/ICPR.2004.1334376
DO - 10.1109/ICPR.2004.1334376
M3 - Article in proceedings
SN - 0-7695-2128-2
SP - 787
EP - 790
BT - Proceedings of the 17th International Conference on Pattern Recognition, 2004
PB - IEEE
T2 - 17th International Conference on Pattern Recognition
Y2 - 23 August 2004 through 26 August 2004
ER -
ID: 5520639