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Significant subgraph mining with multiple testing correction. / Sugiyama, Mahito; López, Felipe Llinares; Kasenburg, Niklas; Borgwardt, Karsten M.
Proceedings of the 2015 SIAM International Conference on Data Mining. Society for Industrial and Applied Mathematics, 2015. p. 37-45.
Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review
Harvard
Sugiyama, M, López, FL, Kasenburg, N & Borgwardt, KM 2015,
Significant subgraph mining with multiple testing correction. in
Proceedings of the 2015 SIAM International Conference on Data Mining. Society for Industrial and Applied Mathematics, pp. 37-45, SIAM International Conference on Data Mining 2015, British Columbia, Canada,
30/04/2015.
https://doi.org/10.1137/1.9781611974010.5APA
Sugiyama, M., López, F. L., Kasenburg, N., & Borgwardt, K. M. (2015).
Significant subgraph mining with multiple testing correction. In
Proceedings of the 2015 SIAM International Conference on Data Mining (pp. 37-45). Society for Industrial and Applied Mathematics.
https://doi.org/10.1137/1.9781611974010.5Vancouver
Sugiyama M, López FL, Kasenburg N, Borgwardt KM.
Significant subgraph mining with multiple testing correction. In Proceedings of the 2015 SIAM International Conference on Data Mining. Society for Industrial and Applied Mathematics. 2015. p. 37-45
https://doi.org/10.1137/1.9781611974010.5Author
Sugiyama, Mahito ; López, Felipe Llinares ; Kasenburg, Niklas ; Borgwardt, Karsten M. / Significant subgraph mining with multiple testing correction. Proceedings of the 2015 SIAM International Conference on Data Mining. Society for Industrial and Applied Mathematics, 2015. pp. 37-45
Bibtex
@inproceedings{f3375ad8cde944e69369d3ee1c52733e,
title = "Significant subgraph mining with multiple testing correction",
author = "Mahito Sugiyama and L{\'o}pez, {Felipe Llinares} and Niklas Kasenburg and Borgwardt, {Karsten M.}",
year = "2015",
doi = "10.1137/1.9781611974010.5",
language = "Dansk",
pages = "37--45",
booktitle = "Proceedings of the 2015 SIAM International Conference on Data Mining",
publisher = "Society for Industrial and Applied Mathematics",
address = "USA",
note = "SIAM International Conference on Data Mining 2015 ; Conference date: 30-04-2015 Through 02-05-2015",
}
RIS
TY - GEN
T1 - Significant subgraph mining with multiple testing correction
AU - Sugiyama, Mahito
AU - López, Felipe Llinares
AU - Kasenburg, Niklas
AU - Borgwardt, Karsten M.
PY - 2015
Y1 - 2015
U2 - 10.1137/1.9781611974010.5
DO - 10.1137/1.9781611974010.5
M3 - Konferencebidrag i proceedings
SP - 37
EP - 45
BT - Proceedings of the 2015 SIAM International Conference on Data Mining
PB - Society for Industrial and Applied Mathematics
T2 - SIAM International Conference on Data Mining 2015
Y2 - 30 April 2015 through 2 May 2015
ER -
