Materialized view selection in feed following systems
Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review
Standard
Materialized view selection in feed following systems. / Chen, Kaiji; Zhou, Yongluan.
Proceedings of the 2016 IEEE International Conference on Big Data. IEEE Press, 2016. p. 442-451.Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review
Harvard
Chen, K & Zhou, Y 2016, Materialized view selection in feed following systems. in Proceedings of the 2016 IEEE International Conference on Big Data. IEEE Press, pp. 442-451, 2016 IEEE International Conference on Big Data, Washington D. C., United States, 05/12/2015. https://doi.org/10.1109/BigData.2016.7840635
APA
Chen, K., & Zhou, Y. (2016). Materialized view selection in feed following systems. In Proceedings of the 2016 IEEE International Conference on Big Data (pp. 442-451). IEEE Press. https://doi.org/10.1109/BigData.2016.7840635
Vancouver
Chen K, Zhou Y. Materialized view selection in feed following systems. In Proceedings of the 2016 IEEE International Conference on Big Data. IEEE Press. 2016. p. 442-451 https://doi.org/10.1109/BigData.2016.7840635
Author
Bibtex
@inproceedings{7798f72e9bb54f6a9668aee3131ded0f,
title = "Materialized view selection in feed following systems",
author = "Kaiji Chen and Yongluan Zhou",
year = "2016",
doi = "10.1109/BigData.2016.7840635",
language = "English",
isbn = "978-1-4673-9006-4",
pages = "442--451",
booktitle = "Proceedings of the 2016 IEEE International Conference on Big Data",
publisher = "IEEE Press",
note = "null ; Conference date: 05-12-2015 Through 08-12-2015",
}
RIS
TY - GEN
T1 - Materialized view selection in feed following systems
AU - Chen, Kaiji
AU - Zhou, Yongluan
PY - 2016
Y1 - 2016
U2 - 10.1109/BigData.2016.7840635
DO - 10.1109/BigData.2016.7840635
M3 - Article in proceedings
SN - 978-1-4673-9006-4
SP - 442
EP - 451
BT - Proceedings of the 2016 IEEE International Conference on Big Data
PB - IEEE Press
Y2 - 5 December 2015 through 8 December 2015
ER -
ID: 179278251