Metric learning by directly minimizing the k-NN training error

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Original languageEnglish
Title of host publication2012 21st International Conference on Pattern Recognition (ICPR)
Number of pages4
PublisherIEEE
Publication date2012
Pages1265-1268
ISBN (Print)978-1-4673-2216-4
Publication statusPublished - 2012
Event21st International Conference on Pattern Recognition - Tsukuba Science City , Japan
Duration: 11 Nov 201215 Nov 2012
Conference number: 21

Conference

Conference21st International Conference on Pattern Recognition
Nummer21
LandJapan
ByTsukuba Science City
Periode11/11/201215/11/2012

ID: 46940283