Edge detection in micrometrology with nearly confocal microscopy

Research output: Contribution to journal › Journal article › Research › peer-review

Standard

Edge detection in micrometrology with nearly confocal microscopy. / Sheppard, CJR; Cox, Ingemar J; Hamilton, DK.

In: Applied Optics, Vol. 23, No. 5, 1984, p. 657-658.

Research output: Contribution to journal › Journal article › Research › peer-review

Harvard

Sheppard, CJR, Cox, IJ & Hamilton, DK 1984, 'Edge detection in micrometrology with nearly confocal microscopy', Applied Optics, vol. 23, no. 5, pp. 657-658.

APA

Sheppard, CJR., Cox, I. J., & Hamilton, DK. (1984). Edge detection in micrometrology with nearly confocal microscopy. Applied Optics, 23(5), 657-658.

Vancouver

Sheppard CJR, Cox IJ, Hamilton DK. Edge detection in micrometrology with nearly confocal microscopy. Applied Optics. 1984;23(5):657-658.

Author

Sheppard, CJR ; Cox, Ingemar J ; Hamilton, DK. / Edge detection in micrometrology with nearly confocal microscopy. In: Applied Optics. 1984 ; Vol. 23, No. 5. pp. 657-658.

Bibtex

@article{c7a97d921dc74f1f91a8a4b1d8791e5b,
title = "Edge detection in micrometrology with nearly confocal microscopy",
author = "CJR Sheppard and Cox, {Ingemar J} and DK Hamilton",
year = "1984",
language = "English",
volume = "23",
pages = "657--658",
journal = "Applied Optics",
issn = "1559-128X",
publisher = "Optical Society of America",
number = "5",

}

RIS

TY - JOUR

T1 - Edge detection in micrometrology with nearly confocal microscopy

AU - Sheppard, CJR

AU - Cox, Ingemar J

AU - Hamilton, DK

PY - 1984

Y1 - 1984

M3 - Journal article

VL - 23

SP - 657

EP - 658

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

IS - 5

ER -

ID: 98300265